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The Search for Near Interface Oxide Traps - First-Principles Calculations on Intrinsic SiO2 Defects

Author(s):
Knaup, J. M.
Deak, P.
Gali, A.
Hajnal, Z.
Frauenheim, T.
Choyke, J. W.
1 more
Publication title:
Silicon carbide and related materials 2004 : ECSCRM 2004 : proceedings of the 5th European Conference on Silicon Carbide and Related Materials, August 31 - September 4 2004, Bologna, Italy
Title of ser.:
Materials science forum
Ser. no.:
483-485
Pub. Year:
2005
Page(from):
569
Page(to):
572
Pages:
4
Pub. info.:
Uetikon-Zuerich: Trans Tech Publications
ISSN:
02555476
ISBN:
9780878499632 [0878499636]
Language:
English
Call no.:
M23650
Type:
Conference Proceedings

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