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Characterization of 4H-SiC PiN Diodes by Micro-Raman Scattering and Photoemission

Author(s):
Thuaire, A.
Mermoux, M.
Crisci, A.
Camara, N.
Bano, E.
Baillet, F.
Pernot, E.
2 more
Publication title:
Silicon carbide and related materials 2004 : ECSCRM 2004 : proceedings of the 5th European Conference on Silicon Carbide and Related Materials, August 31 - September 4 2004, Bologna, Italy
Title of ser.:
Materials science forum
Ser. no.:
483-485
Pub. date:
2005
Page(from):
437
Page(to):
440
Pages:
4
Pub. info.:
Uetikon-Zuerich: Trans Tech Publications
ISSN:
02555476
ISBN:
9780878499632 [0878499636]
Language:
English
Call no.:
M23650
Type:
Conference Proceedings

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