Prediction of the Tolerable Defect Size for Strain Based Design

Prediction of the Tolerable Defect Size for Strain Based Design

Author(s):

Publication title:

PRICM 5 : the Fifth Pacific Rim International Conference on Advanced Materials and Processing, November 2-5, 2004, Beijing, China

Title of ser.:

Materials science forum

Ser. no.:

475-479(4)

Pub. Year:

2005

Page(from):

2731

Page(to):

2734

Pages:

4

Pub. info.:

Uetikon-Zuerich: Trans Tech Publications

ISSN:

02555476

ISBN:

9780878499601 [0878499601]

Language:

English

Call no.:

M23650

Type:

Conference Proceedings

Details

TDL ID:	ZA00014238
Series ID:	PA00000012
Conf. info. (Name):	PRICM : Pacific Rim International Conference on Advanced Materials and Processing
Conf. info. (Number):	5th
Conf. info. (Venue):	Beijing, China
Conf. info. (Date):	2004.11.02-2004.11.05

Similar Items:

1 Conference Proceedings Weld Metal Test Performance Requirements: A Critical Appraisal of Future Needs Denys, R.M., De Baets, P., De Waele, W. Trans Tech Publications	7 Conference Proceedings A thin foil optical strain gage based on silicon-on-insulator microresonators D. Taillaert, W. V. Paepegem, J. Vlekken, R. Baets SPIE - The International Society of Optical Engineering
2 Conference Proceedings Fitness-for-Purpose Assessment of Misaligned Welds Waele, W. De, Denys, R. M., Lefevre, A. Trans Tech Publications	8 Conference Proceedings A Combination of Mathematical Morphology and Thermal Analysis of Wear Debris Explaining Polymer Sliding Mechanisms P. Samyn, A. Ledda, J. Quintelier, I. Van Driessche, G. Schoukens, P. De Baets, W. De Waele Trans Tech Publications
3 Conference Proceedings Development of Defect Interaction Criteria for Pipeline Girth Welds Subjected to Plastic Collapse Conditions Wim Be Waele, Rudi Denys, Antoon Lefevre American Society of Mechanical Engineers	9 Conference Proceedings Optical biosensor based on silicon-on-insulator microring cavities for specific protein binding detection K. M. D. Vos, I. Bartolozzi, P. Bienstman, R. Baets, E. Schacht SPIE - The International Society of Optical Engineering
4 Conference Proceedings Atomic Force Microscopy of Sintered and Thermoplastic Polyimide Surfaces after Macroscopic Wear Tests P. Samyn, J. Quintelier, G. Schoukens, P. De Baets, W. De Waele Trans Tech Publications	10 Conference Proceedings Building technology platforms and foundries for photonic integrated circuits in Europe R. Baets, P. Dumon, W. Bogaerts, A. Chelnokov, J. -M. Fedeli Society of Photo-optical Instrumentation Engineers
5 Conference Proceedings The Interaction of Weld Defects under Plastic Collapse Waele, W. De Trans Tech Publications	11 Conference Proceedings Design and Modelling of Passive an Active Optical Waveguide Devices Baets R., Kaczmarski P., Vankwikelberge P. Kluwer Academic Publishers
6 Conference Proceedings Effect of Material Properties on the Plastic Straining Capacity of Defective Welds Waele, W. De Trans Tech Publications	12 Conference Proceedings The SiC technology is ready for the next generation of extremely large telescopes Bougoin, M., Deny, P. SPIE - The International Society of Optical Engineering

1

2

3

4

5

6

7

8

9

10

11

12