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TEM and TEM-EDX Analysis of Cross-Section of Anti-Reflective Thin Film and Glass Substrate

Author(s):
Yu, X.
Ma, H.
Zuo, Y.
Zhao, H. F.
Luo, W.
Bi, W.
Wang, L.
2 more
Publication title:
PRICM 5 : the Fifth Pacific Rim International Conference on Advanced Materials and Processing, November 2-5, 2004, Beijing, China
Title of ser.:
Materials science forum
Ser. no.:
475-479(2)
Pub. Year:
2005
Page(from):
1579
Page(to):
1582
Pages:
4
Pub. info.:
Uetikon-Zuerich: Trans Tech Publications
ISSN:
02555476
ISBN:
9780878499601 [0878499601]
Language:
English
Call no.:
M23650
Type:
Conference Proceedings

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