Blank Cover Image

Analysis of Macro and Micro Residual Stresses in Functionally Graded Materials by Diffraction Methods

Author(s):
Publication title:
Functionally graded materials 1998 : proceedings of the 5th International Symposium on Functionally Graded Materials, held in New Town Hall, Dresden, Germany, October 26-29, 1998
Title of ser.:
Materials science forum
Ser. no.:
308-311
Pub. Year:
1999
Page(from):
829
Page(to):
836
Pages:
8
Pub. info.:
Uetikon-Zuerich, Switzerland: Trans Tech Publications
ISSN:
02555476
ISBN:
9780878498338 [0878498338]
Language:
English
Call no.:
M23650
Type:
Conference Proceedings

Similar Items:

Genzel, Ch., Reimers, W.

Trans Tech Publications

Reetz, B., Reimers, W.

Trans Tech Publications

C. Genzel, D. Apel, M. Klaus, M. Genzel, D. Balzar

Trans Tech Publications

Stock, C., Genzel, Ch., Reimers, W.

Trans Tech Publications

Klaus, M., Denks, I.A., Genzel, C.

Trans Tech Publications

Reimers, W.

Trans Tech Publications

T. Fuß, R.C. Wimpory, M. Klaus, Ch. Genzel

Trans Tech Publications

I.A. Denks, C. Genzel

Trans Tech Publications

Genzel, C., Denks, I.A., Klaus, M.

Trans Tech Publications

Reimers,W., Baron,U., Klimek,L., Schwarz,W.

Trans Tech Publications

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12