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TEM Study Of High Quality GaN Grown By OMVPE Using An Intermediate Layer

Author(s):
Benamara, Mourad
Liliental-Weber, Z.
Kellermann, S.
Swider, W.
Washburn, J.
Mazur, J.H.
Bourret-Courchesne, E.D.
2 more
Publication title:
Wide-bandgap electronic devices
Title of ser.:
Materials Research Society symposium proceedings
Ser. no.:
622
Pub. Year:
2001
Page(from):
T6.14
Pub. info.:
Warrendale, PA.: Materials Research Society
ISSN:
02729172
ISBN:
9781558995307 [1558995307]
Language:
English
Call no.:
M23500/622
Type:
Conference Proceedings

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