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The Dependence of Poly-Si TFT Characteristics on the Relative Misorientation Between Grain Boundaries and the Active Channel

Author(s):
Jung, Y.H.
Yoon, J.M.
Yang, M.S.
Park, W.K.
Soh, H.S.
Cho, H.S.
Limanov, A.B.
Im, J.S.
3 more
Publication title:
Electron-emissive materials, vacuum microelectronics and flat-panel displsys : symposium held April 25-27 2000, San Francisco, California, U.S.A.
Title of ser.:
Materials Research Society symposium proceedings
Ser. no.:
621
Pub. Year:
2001
Page(from):
Q9.14
Pub. info.:
Pittsburgh, PA.: Materials Research Society
ISSN:
02729172
ISBN:
9781558995291 [1558995293]
Language:
English
Call no.:
M23500/621
Type:
Conference Proceedings

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