Blank Cover Image

In Situ Real-Time Studies of Oxygen Incorporation in Complex Oxide Thin Films Using Spectroscopic Ellipsometry and Ion Scattering and Recoil Spectrometry

Author(s):
Mueller, A.H.
Gao, Y.
Irene, E.A.
Auciello, O.
Krauss, A.R.
Schultz, J.A.
1 more
Publication title:
Recent developments in oxide and metal epitaxy : theory and experiment
Title of ser.:
Materials Research Society symposium proceedings
Ser. no.:
619
Pub. Year:
2000
Page(from):
141
Page(to):
148
Pages:
8
Pub. info.:
Warrendale, Pa.: Materials Research Society
ISSN:
02729172
ISBN:
9781558995277 [1558995277]
Language:
English
Call no.:
M23500/619
Type:
Conference Proceedings

Similar Items:

1 Conference Proceedings In Situ Study of Barrier Layers Using Spectroscopic Ellipsometry and Mass Spectroscopy of Recoiled Ions

Gao, Y., Mueller, A.H., Irene, E.A., Auciello, O., Krauss, A.R., Schultz, J.A.

Materials Research Society
7 Conference Proceedings Studies of Metallic Species Incorporation During Growth of SrBi2Ta2O9 Films on YBa2Cu3O7-x Substrates Using Mass Spectroscopy of Recoiled Ions

Dhote, A. M., Krauss, A. R., Auciello, O., Im, J., Gruen, D. M., Ramesh, R., Pai, S. P., Venkatesan, T.

MRS - Materials Research Society
2 Conference Proceedings Combined Spectroscopic Ellipsometry and Ion Beam Surface Analysis for In Situ, Real-Time Characterization of Complex Oxide Film Growth

Mueller, A. H., Gao, Y., Irene, E. A., Auciello, O., Krauss, A. R., Schultz, J. A.

MRS - Materials Research Society
8 Conference Proceedings IN-SITU, REAL-TIME ANALYSIS OF THE GROWTH OF FERROELECTRIC AND CONDUCTIVE OXIDE HETEROSTRUCTURES BY A NEW TIME-OF-FLIGHT PULSED ION BEAM SURFACE ANALYSIS …

Auciello, Orlando, Krauss, A. R., Lin, Y., Chang, R. P. H., Gruen, D. M.

MRS - Materials Research Society
3 Conference Proceedings In Situ Real-Time Ellipsometry Study of Dynamic Processes of YBa2Cu3O7-x Thin Films

Gao, Y., Mueller, A. H., Irene, E. A., Auciello, O., Krauss, A. R., Schultz, J. A.

MRS - Materials Research Society
9 Conference Proceedings COMPUTER SIMULATION OF SCATTERED ION AND SPUTTERED SPECIES EFFECTS IN ION BEAM SPUTTER-DEPOSITION OF HIGH TEMPERATURE SUPERCONDUCTING THIN FILMS

Krauss, Alan R., Auciello, Orlando

Materials Research Society
4 Conference Proceedings In Situ Real-Time Studies of Film Growth Processes Using Ion Scattering and Direct Recoil Spectroscopy Techniques

Smentkowski, V. S., Krauss, A. R., Auciello, O., Im, J., Gruen, D. M., Holecek, J., Waters, K., Schultz, J. A.

MRS - Materials Research Society
10 Conference Proceedings Study of Interface Formation of (Ba,Sr)TiO3 Thin Films Grown by RF Sputter Deposition on Bare Si and Thermal SiO2/Si Substrates

Suvorova, N.A., Mueller, A.H., Suvorova, A.A., Saunders, M., Irene, E.A.

Materials Research Society
5 Conference Proceedings In Situ Mass Spectroscopy of Recoiled Ion Studies of Degradation Processes in SrBi2Ta2O9 Thin Films During Hydrogen Gas Annealing

Im, J., Auciello, O., Krauss, A. R., Gruen, D. M., Chang, R. P. H., Kim, S. H., Kingon, A. I.

MRS - Materials Research Society
11 Conference Proceedings Spectroscopic ellipsometry studies on vacuum-evaporated zinc selenide thin film

W. Gao

Society of Photo-optical Instrumentation Engineers
6 Conference Proceedings STUDIES ON ION SCATTERING AND SPUTTERING PROCESSES RELEVANT TO ION BEAM SPUTTER DEPOSITION OF MULTICOMPONENT THIN FILMS

Auciello, O., Ameen, M.S., Krauss, A.R., Kingon, A.I., Ray, M.A.

Materials Research Society
12 Conference Proceedings PHYSICAL VAPOR DEPOSITION OF MULTICOMPONENT OXIDE THIN FILMS: TECHNIQUES, BASIC DEPOSITION PROCESSES AND FILM PROCESSING-MICROSTRUCTURE-PROPERTY RELATIONSHIPS

Auciello O., Kingon I. A., Krauss R. A., Lichtenwalner J. D.

Kluwer Academic Publishers
1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12