Nanocrystal Thickness Information From Z-STEM: 3-D Imaging in One Shot

Nanocrystal Thickness Information From Z-STEM: 3-D Imaging in One Shot

Author(s):

Publication title:

Advances in materials problem solving with the electron microscope : symposium held November 30-December 3, 1999, Boston, Massachusetts, U.S.A.

Title of ser.:

Materials Research Society symposium proceedings

Ser. no.:

589

Pub. Year:

2001

Page(from):

229

Page(to):

234

Pages:

6

Pub. info.:

Pittsburgh, Pa.: Materials Research Society

ISSN:

02729172

ISBN:

9781558994973 [1558994971]

Language:

English

Call no.:

M23500/589

Type:

Conference Proceedings

Details

TDL ID:	ZA00014195
Series ID:	PA00000011
Conf. info. (Name):	Symposium on advances in materials problem solving with the electron microscope
Conf. info. (Number):	1999
Conf. info. (Venue):	Boston, MA, USA
Conf. info. (Date):	1999.11.30-1999.12.03

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