Critical Microscopic Processes in Semiconductor Lasers
- Author(s):
- Publication title:
- The optical properties of materials : symposium held November 30-December 2, 1999, Boston, Massachusetts, U.S.A.
- Title of ser.:
- Materials Research Society symposium proceedings
- Ser. no.:
- 579
- Pub. Year:
- 2000
- Page(from):
- 181
- Page(to):
- 192
- Pages:
- 12
- Pub. info.:
- Warrendale, Pa.: Materials Research Society
- ISSN:
- 02729172
- ISBN:
- 9781558994874 [1558994874]
- Language:
- English
- Call no.:
- M23500/579
- Type:
- Conference Proceedings
Similar Items:
SPIE-The International Society for Optical Engineering |
7
Conference Proceedings
Process simulation of selective-area MOCVD growth for optoelectronic integrated circuits
SPIE - The International Society for Optical Engineering |
2
Conference Proceedings
Role of nonequilibrium carrier distributions in multiple quantum well InGaAsP-based lasers
SPIE-The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE - The International Society for Optical Engineering |
Plenum Press |
4
Conference Proceedings
Rote of p-doping profile in InGaAsP multiquantum well lasers:comparison of simulation and experiment
SPIE - The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
Society of Photo-optical Instrumentation Engineers |
Electrochemical Society |
6
Conference Proceedings
Modeling of optical spectra for characterization of multiquantum-well InGaAsP-based lasers
SPIE-The International Society for Optical Engineering |
12
Conference Proceedings
Modeling of the linewidth enhancement factor in multiple quantum well InGaAsP-based lasers
SPIE-The International Society for Optical Engineering |