Evaluation of Youngs Modulus and Yield Strength of Thin Film Structural Material Using Nanoindentation Technique

Evaluation of Youngs Modulus and Yield Strength of Thin Film Structural Material Using Nanoindentation Technique

Author(s):

Publication title:

Polycrystalline metal and magnetic thin films : symposium held April 5-8, 1999, San Francisco, California, U.S.A.

Title of ser.:

Materials Research Society symposium proceedings

Ser. no.:

562

Pub. Year:

1999

Page(from):

201

Page(to):

208

Pages:

8

Pub. info.:

Warrendale, PA: Materials Research Society

ISSN:

02729172

ISBN:

9781558994690 [1558994696]

Language:

English

Call no.:

M23500/562

Type:

Conference Proceedings

Details

TDL ID:	ZA00014190
Series ID:	PA00000011
Conf. info. (Name):	Symposium on polycrystalline metal and magnetic thin films
Conf. info. (Number):	1999
Conf. info. (Venue):	San Francisco, CA, USA
Conf. info. (Date):	1999.04.05-1999.04.08

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