Blank Cover Image

Ultrafast Silicon Based Internal Photoemission Detectors ..

Author(s):
Publication title:
Flat-panel displays and sensors - principles, materials and processes : symposium held April 4-9, 1999, San Francisco, California, U.S.A.
Title of ser.:
Materials Research Society symposium proceedings
Ser. no.:
558
Pub. date:
2000
Page(from):
167
Page(to):
174
Pages:
8
Pub. info.:
Pittsburgh, Pa.: Materials Research Society
ISSN:
02729172
ISBN:
9781558994652 [1558994653]
Language:
English
Call no.:
M23500/558
Type:
Conference Proceedings

Similar Items:

Mantl, S., Kappius, L., Antons, A., Loken, M., Klinkhammer, F., Dolle, M., Zhao, Q. T., Mesters, S., Buchal, Ch., Bay, …

MRS - Materials Research Society

Zhao,Q.T., Kappius,L., Mesters,St., Mantl,S.

SPIE - The International Society for Optical Engineering

Buchal, Ch., Roelofs, A., Siegert, M., Loken, M.

MRS-Materials Research Society

M. Casalino, L. Sirleto, L. Moretti, F. D. Corte, I. Rendina

SPIE - The International Society of Optical Engineering

3 Conference Proceedings Silicon-Based Optoelectronics

Buchal, Ch., Loken, M., Siegert, M.

MRS - Materials Research Society

Lin, T.L., Ksendzov, A., Dejewski, S.M., Jones, E.W., Fathauer, R.W., Krabach, T.N., Maserjian, J., Terhune, R.W.

Materials Research Society

Kappius, L., Tyagi, A. K., Breuer, U., Bay, H. L., Mantl, S.

MRS - Materials Research Society

Perera,A.G.U., Shen,W.Z., Liu,H.C., Buchanan,M., Tanner,M.O., wang,K.L.

SPIE-The International Society for Optical Engineering

Buchal, Ch., Mantl, S., Thomas, D. K.

Materials Research Society

Klinkhammer, F., Kappius, L., Antons, A., Dolle, M., Trinkaus, H., Mesters, St., Bochem, H-P., Mantl, S., Heinig, K-H.

MRS - Materials Research Society

Mantl, S., Buchal, Ch., Stritzker, B., Saftic, B.

Materials Research Society

Casalino, M., Sirleto, L., Morreti, L., Libertino, S., Rendina, I.

SPIE - The International Society of Optical Engineering

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12