Effect of LDD overlap on transistor self latch-up and on hot carrier degradation
- Author(s):
- Publication title:
- Proceedings of the Sixth International Symposium on Silicon-on-Insulator Technology and Devices
- Title of ser.:
- Electrochemical Society Proceedings Series
- Ser. no.:
- 1994-11
- Pub. Year:
- 1994
- Page(from):
- 339
- Page(to):
- 344
- Pages:
- 6
- Pub. info.:
- Pennington, NJ: Electrochemical Society
- ISSN:
- 01616374
- ISBN:
- 9781566770439 [1566770432]
- Language:
- English
- Call no.:
- E23400/941388
- Type:
- Conference Proceedings
Similar Items:
Electrochemical Society |
7
Conference Proceedings
An Advanced Well Structure to Improve Latch-Up Immunity for CMOS Technology
Electrochemical Society |
Electrochemical Society |
SPIE-The International Society for Optical Engineering |
3
Conference Proceedings
Hot Carrier Effects in Self-Aligned and Offset-Gated Polysilicon Thin-Film Transistors
Materials Research Society |
9
Conference Proceedings
Luminescent biotest for the express control of general toxicity of environment
SPIE-The International Society for Optical Engineering |
MRS - Materials Research Society |
10
Conference Proceedings
Ultrafast Relaxation Character of Nonequilibrium Carriers in GaAs Excited by Femtosecond Laser
Trans Tech Publications |
Electrochemical Society |
SPIE - The International Society of Optical Engineering |
6
Conference Proceedings
Interdependence and Significance of Hot Carrier Stress (HCS) and Gate Induced (GIDL) Drain Leakage Current in BC SOT pMOSFETs
Electrochemical Society |
Electrochemical Society |