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A SEMI-QUANTITATIVE METHOD FOR STUDYING PHOTORESIST STRIPPING

Author(s):
Rotondaro, A.L.P.
Meuris, M.
Schmidt, H.F.
Heyns, M.M.
Vandervorst, W.
Claeys, C.
Hellemans, L.
Snauvaert, I.
3 more
Publication title:
Proceedings of the Third International Symposium on Cleaning Technology in Semiconductor Device Manufacturing
Title of ser.:
Electrochemical Society Proceedings Series
Ser. no.:
1994-7
Pub. Year:
1994
Page(from):
581
Page(to):
586
Pages:
6
Pub. info.:
Pennington, NJ: Electrochemical Society
ISSN:
01616374
ISBN:
9781566770385 [1566770386]
Language:
English
Call no.:
E23400/941397
Type:
Conference Proceedings

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