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The Effect of COP on the Dielectric Breakdown Characteristics of Silicon MOS Capacitor

Author(s):
Shiota, T.
Morita, E.
Furukawa, J.
Furuya, H.
Shingyouji, T.
Shimanuki, Y.
1 more
Publication title:
Proceedings of the Symposium on Contamination Control and Defect Reduction in Semiconductor Manufacturing II
Title of ser.:
Electrochemical Society Proceedings Series
Ser. no.:
1994-3
Pub. Year:
1994
Page(from):
211
Page(to):
221
Pages:
11
Pub. info.:
Pennington, NJ: Electrochemical Society
ISSN:
01616374
ISBN:
9781566770651 [1566770653]
Language:
English
Call no.:
E23400/941395
Type:
Conference Proceedings

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