Blank Cover Image

The Impact of Processing-Induced Defects on the Electrical Characteristics and the Degradation of Si n+p Junctions

Author(s):
Publication title:
Proceedings of the Symposium on the Degradation of Electronic Devices due to Device Operation as well as Crystalline and Process-Induced Defects
Title of ser.:
Electrochemical Society Proceedings Series
Ser. no.:
1994-1
Pub. date:
1994
Page(from):
72
Page(to):
81
Pages:
10
Pub. info.:
Pennington, NJ: Electrochemical Society
ISSN:
01616374
ISBN:
9781566770378 [1566770378]
Language:
English
Call no.:
E23400/941393
Type:
Conference Proceedings

Similar Items:

1 Conference Proceedings ON THE ELECTRICAL ACTIVITY OF OXYGEN-RELATED EXTENDED DEFECTS IN SILICON

Vanhellemont, J., Simoen, E., Bosman, G., Claeys, C., Kaniava, A., Gaubas, E., Blondeel, A., Clauws, P.

Electrochemical Society
7 Conference Proceedings Lattiee defects in Si1-xGex epitaxial diodes induced by 20-MeV alpha rays

Ohyama,H., Vanhellemont,J., Simoen,E., Claeys,C., Takami,Y., Hayama,K., Sunaga,H., Poortmans,J., Caymax,M.

Trans Tech Publications
2 Conference Proceedings On the Recombination Activity of Oxygen Precipitation Related Lattice Defects in Silicon

Vanhellemont, J., Kaniava, A., Libezny, M., Simoen, E., Kissinger, G., Gaubas, E., Claeys, C., Clauws, P.

MRS - Materials Research Society
8 Conference Proceedings Irradiation induced lattice defects in In0.53Ga0.47As PIN photodiodes

Kudou,T., Ohyama,H., Vanhellemont,J., Simoen,E., Claeys,C., Takami,Y., Fujii,A., Sunaga,H.

Trans Tech Publications
3 Conference Proceedings Lattice Defects in High Resistivity Silicon

Claeys, C., Simoen, E., Vanhellemont, J.

Electrochemical Society
9 Conference Proceedings PL study of oxygen related defects in silicon

Libezny, M., Kaniava, A., Kissinger, G., Nijs, J., Claeys, C., Vanhellemont, J.

Electrochemical Society
4 Conference Proceedings On the Role of Point Defects in Gettering Processes

Vanhellemont,J., Claeys,C.

Trans Tech Publications
10 Conference Proceedings THE ROLE OF POINT DEFECTS IN THE NUCLEATION OF FILM EDGE INDUCED DISLOCATIONS IN SILICON.

VANHELLEMONT,J., CLAEYS,C., LANDUYT,J.VAN

Trans Tech Publications
5 Conference Proceedings Impact of processing parameters on leakage current and defect behaviour of N+P silicon junction diodes

Gramenova, E., Jansen, Ph., Simoen, E., Vanhellemont, J., Dupas, L., Deferm, L.

Electrochemical Society
11 Conference Proceedings The effect of substrate radiation-induced defects on the operation of deep submicron silicon technologies

Simoen, E., Claeys, C., Poyai, A.

Electrochemical Society
6 Conference Proceedings Proton irradiation induced lattice defects in Si diodes and their effects on device performance

Ohyama, H., Simoen, E., Claeys, C., Vanhellemont, J., Takami, Y., Hayama, T., Sunaga, H., Kobayashi, K.

Electrochemical Society
12 Conference Proceedings Defect Behavior and Control in Advanced CMOS Process Technologies

Claeys, C., Simoen, E.

Electrochemical Society
1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12