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IMPROVED RINSING EFFICIENCY ON POST-ETCH RESIDUE WET CLEAN FOR Cu/LOW-k DAMASCENE STRUCTURES

Author(s):
Publication title:
Cleaning technology in semiconductor device manufacturing VIII : proceedings of the international symposium
Title of ser.:
Electrochemical Society Proceedings Series
Ser. no.:
2003-26
Pub. date:
2003
Page(from):
27
Page(to):
33
Pages:
7
Pub. info.:
Pennington, NJ: Electrochemical Society
ISSN:
01616374
ISBN:
9781566774116 [156677411X]
Language:
English
Call no.:
E23400/200326
Type:
Conference Proceedings

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