Blank Cover Image

Silicon Wafer Bonding for Encapsulating Surface-Micromechanical-Systems using Intermediate Glass Layers

Author(s):
Publication title:
Semiconductor wafer bonding : science, technology, and applications : proceedings of the international symposia
Title of ser.:
Electrochemical Society Proceedings Series
Ser. no.:
2003-19
Pub. Year:
2003
Page(from):
321
Page(to):
328
Pages:
8
Pub. info.:
Pennington, NJ: Electrochemical Society
ISSN:
01616374
ISBN:
9781566774024 [1566774020]
Language:
English
Call no.:
E23400/200319
Type:
Conference Proceedings

Similar Items:

Wiemer, M., Fromel, J., Jia, C., Gessner, T.

Electrochemical Society

J. Sun, Y.G. Li, J.Q. Liu, C.S. Yang, D.N. He

Trans Tech Publications

F. Sari, M. Wiemer, M. Bernasch, J. Bagdahn

Electrochemical Society

Bagdahn, J., Ploessl, A., Wiemer, M., Petzold, M.

Electrochemical Society

3 Conference Proceedings Aspects of Bonding Processed CMOS Wafers

R. Knechtel

Electrochemical Society

Dragoi, V., Alexe, M., Reiche, M.

Electrochemical Society

R. Knechtel

Electrochemical Society

M. Wiemer, M. Haubold, C. Jia, D. Wuensch, J. Froemel

Electrochemical Society

Knechtel, R., Dahlmann, G., Schwarz, U.

Electrochemical Society

R. Knechtel

Electrochemical Society

Chung, G.-S., Kim, J.M.

SPIE - The International Society of Optical Engineering

Wiemer, M., Hiller, K., Hahn, R., Kaufmann, C., Gessner, T.

Electrochemical Society

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12