Blank Cover Image

Nature of high-temperature charge instability of fully depleted SOI MOSFETs

Author(s):
Publication title:
Silicon-on-insulator technology and devices XI : proceedings of the international symposium
Title of ser.:
Electrochemical Society Proceedings Series
Ser. no.:
2003-5
Pub. date:
2003
Page(from):
455
Page(to):
460
Pages:
6
Pub. info.:
Pennington, N.J.: Electrochemical Society
ISSN:
01616374
ISBN:
9781566773751 [156677375X]
Language:
English
Call no.:
E23400/200305
Type:
Conference Proceedings

Similar Items:

Nazarov, A.N., Houk, Y., Vovk, Ya.N., Lysenko, V.S., Flandre, D.

Electrochemical Society

Lysenko, V.S., Nazarov, A.N., Rudenko, T.E., Rudenko, A.N., Kilchitskaya, V.I., Givargizov, E.I., Limanov, A.B.

Electrochemical Society

Houk, Y., Nazarov, A. N., Turchanikov, V. I., Lysenko, V. S., Adriaensen, S., Flandre, D.

Kluwer Academic Publishers

Kiichytska, V., Chung, T.M., van Meer, H., de Meyer, K., Raskin, J.P., Flandre, D.

Electrochemical Society

Nazarov, A N, Barchuk, I P, Lysenko, V S L, Colinge, J P

Electrochemical Society

Gillon, R., Raskin, J.P., Vanhoenacker, D., Colinge, J.P., Dambrine, G.

Electrochemical Society

Nazarov, A.N.

Kluwer Academic Publishers

Nazarov, A.N., Osiyuk, I.N., Tyagulskii, I.P., Lysenko, V.S., Gebel, T., Skorupa, W.

Electrochemical Society

Vandooren, A., Cristoloveanu, S., Colinge, J.P., Flandre, D.

Electrochemical Society

Chen, J., Colinge, J.P., Flandre, D., Gillon, R., Raskin, J.P., Vanhoenacker, D.

Electrochemical Society

Raskin, B. Inilguez. J.P., Demeus, L., Neve, A., Goffioul, M., Simon, P., Vanhoenacker, D., Flandre, D.

Electrochemical Society

Bawedin, M., Yun, J.G., Cristoloveanu, S., Lee, H.D., Raynaud, C., Flandre, D.

Electrochemical Society

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12