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Radiation damage in deep submicron partially depleted SOI CMOS

Author(s):
Simoen, E.
Rafi, J.M.
Mercha, A.
Serra-Gallifa, X.
van Meer, H.
De Meyer, K.
Claeys, C.
Kokkoris, M.
Kossionides, E.
Fanourakis, G.
5 more
Publication title:
Silicon-on-insulator technology and devices XI : proceedings of the international symposium
Title of ser.:
Electrochemical Society Proceedings Series
Ser. no.:
2003-5
Pub. date:
2003
Page(from):
437
Page(to):
442
Pages:
6
Pub. info.:
Pennington, N.J.: Electrochemical Society
ISSN:
01616374
ISBN:
9781566773751 [156677375X]
Language:
English
Call no.:
E23400/200305
Type:
Conference Proceedings

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