Blank Cover Image

Modeling and Electrical Characterization of MOS Structures with Ultra-Thin Gate Oxide

Author(s):
Publication title:
Silicon nitride and silicon dioxide thin insulating films VII : proceedings of the international symposium
Title of ser.:
Electrochemical Society Proceedings Series
Ser. no.:
2003-2
Pub. Year:
2003
Page(from):
551
Page(to):
572
Pages:
22
Pub. info.:
Pennington, N.J.: Electrochemical Society
ISSN:
01616374
ISBN:
9781566773478 [1566773474]
Language:
English
Call no.:
E23400/200302
Type:
Conference Proceedings

Similar Items:

1 Conference Proceedings Characterization of Thin MOS Gate Oxides Grown in Pyrogenic Environment

Nogueira, W. A., dos Santos Filho, S. G.

Electrochemical Society
7 Conference Proceedings *Challenges in interface trap characterization of deep sub-micron MOS devices using charge pumping techniques

Autran, J. L., Masson, P., Ghibaudo, G.

MRS-Materials Research Society
2 Conference Proceedings Gate Oxide Thinning in MOS Structures with Shallow Trench Isolation

Balasubramanian, N., Johnson, E., Perera, C., Mian, C.-S., Sheng, T.-T., Peidous, I.V., Ping, C., Cuthbertson, A., …

Electrochemical Society
8 Conference Proceedings Si Channel Surface Dependence of Electrical Characteristics in Ultra-Thin Gate Oxide CMOS*

Momose, H.S.

Electrochemical Society
3 Conference Proceedings Electrical Characterization of Thin Gate Oxynitride Obtained by N+ Implantation into Polysilicon/ Thermal Oxide/ Silicon Structure

Toquetti, L. Z., dos Santos Filho, S. G., Diniz, J. A., Swart, J. W.

Electrochemical Society
9 Conference Proceedings Electrical Characterization of MOS Structures with Deposited Oxides Annealed in N2O or NO

M. Grieb, M. Noborio, D. Peters, A.J. Bauer, P. Friedrichs

Trans Tech Publications
4 Conference Proceedings Characterization of MOS Structures with Ultra-Thin Tunneling Oxynitride

Fujioka, H., Wann, C., Park, D., Hu, C.

MRS - Materials Research Society
10 Conference Proceedings Characterization of 4H-SiC MOS Structures with Al2O3 as Gate Dielectric

Paskaleva, A., Ciechonski, R. R., Syvajarvi, M., Atanassova, E., Yakimova, R.

Trans Tech Publications
5 Conference Proceedings Extraction of the Slow Oxide Trap Concentration Profiles in MOS Transistors Using the Charge Pumping Technique

Maneglia, Y., Bauza, D., Ghibaudo, G.

Electrochemical Society
11 Conference Proceedings Temperature Dependence of Gate-Induced-Drain-Leakage (GIDL) Current in Thin-Film SOl MOSFETs

Jomaah, J., Ghibaudo, G., Balestra, F.

Electrochemical Society
6 Conference Proceedings Challenges of Forming Ultra Thin Gate Oxides

Arghavani, R.

Electrochemical Society
12 Conference Proceedings Characterization and modeling of Defects in High-k Layers Through Fast Electrical Transient Measurements

Mitard, J., Leroux, C., Reimbold, G., Garros, X., Martin, F., Ghibaudo, G.

Springer
1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12