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Progress in Novel Oxides for Gate Dielectrics And Surface Passivation of GaN/AlGaN Heterostructure Field Effect Transistors

Author(s):
Abernathy, C.R. ( (University of Florida) )
Gila, B.P. ( (University of Florida) )
Onstine, A.H. ( (University of Florida) )
Pearton, S.J. ( (University of Florida) )
Kim, J. ( (University of Florida) )
Luo, B. ( (University of Florida) )
Mehandru, R. ( (University of Florida) )
Ran, F. ( (University of Florida) )
Gillespie, J.K. ( (Air Force Research Laboratory) )
Fitch, R.C. ( (Air Force Research Laboratory) )
Sewell, J. ( (Air Force Research Laboratory) )
Dettmer, R. ( (Air Force Research Laboratory) )
Via, G.D. ( (Air Force Research Laboratory) )
Crespo, A. ( (Air Force Research Laboratory) )
Jenkins, T.J. ( (Air Force Research Laboratory) )
Irokawa, Y. ( (Toyota Central Research and Development Laboratories, Inc.) )
11 more
Publication title:
Dielectrics in emerging technologies : proceedings of the international symposium
Title of ser.:
Electrochemical Society Proceedings Series
Ser. no.:
2003-1
Pub. date:
2003
Page(from):
330
Page(to):
341
Pages:
12
Pub. info.:
Pennington, N.J.: Electrochemical Society
ISSN:
01616374
ISBN:
9781566773461 [1566773466]
Language:
English
Call no.:
E23400/200301
Type:
Conference Proceedings

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