Blank Cover Image

In-Situ Observations of Point Defect Generation and Complexing During Electron Beam Irradiation of Nitrogen Doped Czochralski Silicon

Author(s):
Publication title:
High purity silicon VII : proceedings of the international symposium
Title of ser.:
Electrochemical Society Proceedings Series
Ser. no.:
2002-20
Pub. date:
2002
Page(from):
347
Page(to):
356
Pages:
10
Pub. info.:
Pennington, N.J.: Electrochemical Society
ISSN:
01616374
ISBN:
9781566773447 [156677344X]
Language:
English
Call no.:
E23400/200220
Type:
Conference Proceedings

Similar Items:

Stoddard, Nathan G., Duscher, Gerd, Windl, Wolfgang, Rozgonyi, George A.

Materials Research Society

Cho, C. R., Yarykin, N., Rozgonyi, G. A., Zuhr, R. A.

MRS - Materials Research Society

Karoui, F.Sahtout, Karoui, A., Inoue, N., Rozgonyi, G.A.

Materials Research Society

Jenkins,M.L., Hardy,G.J., Kirk,M.A.

Trans Tech Publications

Funao, D., Ohkubo, I., Inoue, N., Karoui, A., Rozgonyi, G.A.

Electrochemical Society

Honeycutt W. J., Rozgonyi A. G.

Kluwer Academic Publishers

Karoui, A., Rozgonyi, G., Ciszek, T.

Materials Research Society

W. Zhao, G. Duscher, G. Rozgonyi

Electrochemical Society

Karoui, A., Karoui, F.S., Rozgonyi, G.A., Hourai, M., Sueoka, K.

Electrochemical Society

Cho, C.R., Yarykin, N., Rozgonyi, G.A., Zuhr, R.A.

Electrochemical Society

Karoui, A., Karoui, F.S., Rozgonyi, G.A., Hourai, M., Sueoka, K.

Electrochemical Society

Karoui, F., Sahtout, Karoui A., Rozgonyi, G.

Materials Research Society

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12