Blank Cover Image

Segregation of Nitrogen in Cz Silicon

Author(s):
Inoue, N.  
Publication title:
High purity silicon VII : proceedings of the international symposium
Title of ser.:
Electrochemical Society Proceedings Series
Ser. no.:
2002-20
Pub. Year:
2002
Page(from):
127
Page(to):
132
Pages:
6
Pub. info.:
Pennington, N.J.: Electrochemical Society
ISSN:
01616374
ISBN:
9781566773447 [156677344X]
Language:
English
Call no.:
E23400/200220
Type:
Conference Proceedings

Similar Items:

Inoue, N., Fujiyama, N., Yagi, H.

SPIE-The International Society for Optical Engineering

Hashimoto, A., Matsumoto, T., Funao, D., Inoue, N.

Electrochemical Society

Inoue, N., Fujiyama, N., Yagi, H.

Electrochemical Society

8 Conference Proceedings Nucleation of Void Defects in Cz Silicon

Yamanaka, Y., Tanahashi, K., Mikayama, T., Inoue, N., Mon, A.

Electrochemical Society

Inoue, N., Shingu, K., Masumoto, K.

Electrochemical Society

9 Conference Proceedings Nucleation of Void Defects in Cz Silicon

Yamanaka,Y., Tanahashi,K., Mikayama,T., Inoue,N., Mori,A.

Electrochemical Society, SPIE-The International Society for Optical Engineering

Inoue, N., Shingu, K., Masumoto, K.

Electrochemical Society

Masumoto, K., Nozaki, T., Yagi, H., Minai, Y., Saito, Y., Futatsugawa, S., Inoue, N.

Electrochemical Society

Funao, D., Ohkubo, I., Inoue, N., Karoui, A., Rozgonyi, G.A.

Electrochemical Society

Tanahashi, K., Inoue, N., Mizokawa, Y.

MRS - Materials Research Society

N. Inoue, A. Karen, H. Yagi, K. Masumoto, M. Shinomiya, K. Kashima, K. Eifuku, M. Koizumi, T. Takahashi, T. Takenawa, K. …

Electrochemical Society

Nakatsu, M., Hashimoto, A., Natsume, A., Inoue, N., Ono, H.

Electrochemical Society

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12