The Intercation Among Defects During High Temperature Annealing of High Purity SIC
- Author(s):
- Publication title:
- State-of-the-art program on compound semiconductors XXXVI and wide bandgap semiconductors for photonic and electronic devices and sensors II : proceedings of the international symposia
- Title of ser.:
- Electrochemical Society Proceedings Series
- Ser. no.:
- 2002-3
- Pub. Year:
- 2002
- Page(from):
- 258
- Page(to):
- 265
- Pages:
- 8
- Pub. info.:
- Pennington, N.J.: Electrochemical Society
- ISSN:
- 01616374
- ISBN:
- 9781566773690 [1566773695]
- Language:
- English
- Call no.:
- E23400/2002-3
- Type:
- Conference Proceedings
Similar Items:
SPIE-The International Society for Optical Engineering |
7
Conference Proceedings
Cross-Sectional Transmission Electron Microscopy Parallel to the Active Stripe of Degraded Buried Heterostructure Distributed Feedback Laser Devices
Electrochemical Society |
Electrochemical Society |
Electrochemical Society |
3
Conference Proceedings
Laser Diode Degradation: Important Understanding for Material and Structural Improvements
Electrochemical Society |
Electrochemical Society |
Electrochemical Society |
Materials Research Society |
Trans Tech Publications |
11
Conference Proceedings
High-Speed Integrated Laser/Modulator Source: A Key Enabler for WDM Systems
Electrochemical Society |
6
Conference Proceedings
ORIGIN OF GROWN-IN DISLOCATIONS IN III-V COMPOUND SEMICONDUCTORS EPITAXIAL LAYERS
Materials Research Society |
Trans Tech Publications |