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Electrical Characterization of GaN Metal Oxide Semiconductor Diodes Using MgO As The Gate Oxide

Author(s):
Kim. J.
Gila, B.P.
Mehandru, R.
Johnson, J.W.
Shin, J.H.
Lee, K.P.
Luo. B.
Oristine, A.
Abernathy, C.R.
Prarton, S.J.
Ren, F.
6 more
Publication title:
State-of-the-art program on compound semiconductors XXXVI and wide bandgap semiconductors for photonic and electronic devices and sensors II : proceedings of the international symposia
Title of ser.:
Electrochemical Society Proceedings Series
Ser. no.:
2002-3
Pub. Year:
2002
Page(from):
184
Page(to):
190
Pages:
7
Pub. info.:
Pennington, N.J.: Electrochemical Society
ISSN:
01616374
ISBN:
9781566773690 [1566773695]
Language:
English
Call no.:
E23400/2002-3
Type:
Conference Proceedings

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