Blank Cover Image

GROWN-IN MICRODEFECT DISTRIBUTION IN DOPED SILICON CRYSTALS

Author(s):
Publication title:
Semiconductor silicon 2002 : proceedings of the ninth International Symposium on Silicon Materials Science and Technology
Title of ser.:
Electrochemical Society Proceedings Series
Ser. no.:
2002-2
Pub. Year:
2002
Page(from):
505
Page(to):
516
Pages:
12
Pub. info.:
Pennington, NJ: Electrochemical Society
ISSN:
01616374
ISBN:
9781566773744 [1566773741]
Language:
English
Call no.:
E23400/2002-2
Type:
Conference Proceedings

Similar Items:

Borioneui, G., Gambaro, D., Porrini, M., Voronkov, V.V.

Electrochemical Society

Voronkova, G.I., Batunina, A.V., Voronkov, V.V., Falster, R., Porrini, M.

Electrochemical Society

Kulkarni, M.S., Voronkov, V.V.

Electrochemical Society

Porrini, M., Gambaro, D., Geranzani, P., Falster, R.

Electrochemical Society

Voronkov, V.V., Falster, R.

Electrochemical Society

Kulkami, M.S., Voronkov, V.V., Falster, R.

Electrochemical Society

Voronkov, V.V., Falster, R.

Electrochemical Society

10 Conference Proceedings Point defects in silicon crystal growth

Voronkov, V.V., Falster, R.

Electrochemical Society

Porrini, M., Pretto, M.G., Scala, R., Voronkov, V.V.

SPIE-The International Society for Optical Engineering

Takeno, H., Ushio, S., Takenaka, T.

Materials Research Society

Porrini, M., Pretto, M.G., Scala, R., Voronkov, V.V.

Electrochemical Society

Porrini, M., Borionetti, G., Ferrero, G.

Electrochemical Society

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12