Adhesion Properties of PMSSQ-Based Low Dielectric Constant Films by Modified Edge Lift-Off Test
- Author(s):
Kim, Y.D. Sin, D.S. Moon, M.S. Kang, J.W. Nam, H.Y. Choi, B.K. Kang, K.K. Ko, M.J. - Publication title:
- Thin film materials, processes, and reliability : proceedings of the international symposium
- Title of ser.:
- Electrochemical Society Proceedings Series
- Ser. no.:
- 2001-24
- Pub. Year:
- 2001
- Page(from):
- 185
- Page(to):
- 192
- Pages:
- 8
- Pub. info.:
- Pennington, N.J.: Electrochemical Society
- ISSN:
- 01616374
- ISBN:
- 9781566773577 [1566773571]
- Language:
- English
- Call no.:
- E23400/200124
- Type:
- Conference Proceedings
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