Acceptance Sampling Schemes For CATi Chip EFR Inspection

Acceptance Sampling Schemes For CATi Chip EFR Inspection

Author(s):: Wang, Eugene
Publication title:: Semiconductor technology (ISTC 2001) : proceedings of the 1st International Conference on Semiconductor Technology
Title of ser.:: Electrochemical Society Proceedings Series
Ser. no.:: 2001-17
Pub. Year:: 2001
Page(from):: 604
Page(to):: 609
Pages:: 6
Pub. info.:: Pennington, N.J.: Electrochemical Society
ISSN:: 01616374
ISBN:: 9781566773508 [1566773504]
Language:: English
Call no.:: E23400/200117
Type:: Conference Proceedings

Details

TDL ID:	ZA00014020
Series ID:	PA00000028
Conf. info. (Name):	International Conference on Semiconductor Technology - ISTC
Conf. info. (Number):	1st (2001)
Conf. info. (Venue):	Shanghai, China
Conf. info. (Date):	2001.05.27-2001.05.30

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