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Impact of Body-to-Body Leakage on MOSFET Design Scaling in Partially Depleted SOI

Author(s):
Sleight, J.W.
Bryant, A.
Clark, W.
leong, M.
Nowak, E.J.
Rausch, W.
Sherony, M.J.
2 more
Publication title:
Silicon-on-Insulator Technology and Devices X : proceedings of the tenth International Symposium
Title of ser.:
Electrochemical Society Proceedings Series
Ser. no.:
2001-3
Pub. date:
2001
Page(from):
245
Page(to):
250
Pages:
6
Pub. info.:
Pennington, N.J.: Electrochemical Society
ISSN:
01616374
ISBN:
9781566773096 [1566773091]
Language:
English
Call no.:
E23400/2001-3
Type:
Conference Proceedings

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