Blank Cover Image

Modeling of the Leakage Drain Current in Accumulation-Mode SOI pMOSFETs for High-Temperature Applications

Author(s):
Publication title:
Silicon-on-Insulator Technology and Devices X : proceedings of the tenth International Symposium
Title of ser.:
Electrochemical Society Proceedings Series
Ser. no.:
2001-3
Pub. date:
2001
Page(from):
233
Page(to):
238
Pages:
6
Pub. info.:
Pennington, N.J.: Electrochemical Society
ISSN:
01616374
ISBN:
9781566773096 [1566773091]
Language:
English
Call no.:
E23400/2001-3
Type:
Conference Proceedings

Similar Items:

Bellodi, M, Martino, J A

Electrochemical Society

Bellodi, M., Martino, J.A.

Electrochemical Society

Bellodi, M., Martino, J. A.

Electrochemical Society

Iniguez, B., Rauly, F., Flandre, D.

Electrochemical Society

Bellodi, M., Martino, J.A.

Electrochemical Society

Dessard, V., Iniguez, B., Adriaensen, S., Flandre, D.

Kluwer Academic Publishers

Bellodi, Marcello, Martino, Joao Antonio

Electrochemical Society

Souza, M., Pavanello, M. A., Iniguez, B., Flandre, D.

Electrochemical Society

Bellodi, M., Martino, J.A.

Electrochemical Society

M. Bellodi, L.M. Almeida

Electrochemical Society

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12