Blank Cover Image

Hot-Carrier Effects in l)eep Submicron SOI-MOSFETs during Off-state Operation: Aging Characteristics and Defect Evaluation

Author(s):
Publication title:
Silicon-on-Insulator Technology and Devices X : proceedings of the tenth International Symposium
Title of ser.:
Electrochemical Society Proceedings Series
Ser. no.:
2001-3
Pub. Year:
2001
Page(from):
169
Page(to):
174
Pages:
6
Pub. info.:
Pennington, N.J.: Electrochemical Society
ISSN:
01616374
ISBN:
9781566773096 [1566773091]
Language:
English
Call no.:
E23400/2001-3
Type:
Conference Proceedings

Similar Items:

Dimitrakis, P., Jomaah, J., Balestra, F., Papaioannou, G.J.

Kluwer Academic Publishers

Jomaah, J., Balestra, F.

Kluwer Academic Publishers

Renn, S.H., Pelloie, J.L., Balestra, F.

Electrochemical Society

Renn, S.H., Pauly, E., Pelloie, J.L., Balestra, F.

Electrochemical Society

Jomaah, J., Balestra, F., Ghibaudo, G.

Electrochemical Society

Jomaah, J., Balestra, F.

SPIE-The International Society for Optical Engineering

Jomaah, J, Ghibaudo, G, Pelloie, J L, Balestra, F

Electrochemical Society

Balestra, F.

Electrochemical Society

J. Jomaah, F. Balestra, G. Ghibaudo

Electrochemical Society

Jomaah, J., Ghibaudo, G., Balestra, F.

Electrochemical Society

Jomaah, J, Ghibaudo, G, Balestra, F

Electrochemical Society

Balestra, F.

Kluwer Academic Publishers

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12