Blank Cover Image

Influence of the Back Gate Bias on the Properties of SOI LDMOSFETs

Author(s):
Publication title:
Silicon-on-Insulator Technology and Devices X : proceedings of the tenth International Symposium
Title of ser.:
Electrochemical Society Proceedings Series
Ser. no.:
2001-3
Pub. date:
2001
Page(from):
151
Page(to):
156
Pages:
6
Pub. info.:
Pennington, N.J.: Electrochemical Society
ISSN:
01616374
ISBN:
9781566773096 [1566773091]
Language:
English
Call no.:
E23400/2001-3
Type:
Conference Proceedings

Similar Items:

Vandooren, A., Cristoloveanu, S., Colinge, J.P., Flandre, D.

Electrochemical Society

Cristoloveanu, S.

Electrochemical Society

2 Conference Proceedings Substrate bias effects in SOI FinFETs

Pretet, J., Dauge, F., Vandooren, A., Mathew, L., Nguyen, B.-Y., Jomash, J., Cristoloveanu, S.

Electrochemical Society

Cristoloveanu, S.

Electrochemical Society

S. Cristoloveanu

Electrochemical Society

Nicolett, A.S., Martino, J.A., Simoen, E., Claeys, C.

Electrochemical Society

K. Na, S. Eminente, S. Cristoloveanu, L. Mathew, A. Vandooren, Y. Bae, J. Lee

Electrochemical Society

Park, J.M., Grasser, T., Selberberr, S.

Electrochemical Society

Cristoloveanu, S.

Kluwer Academic Publishers

Cirba, C.R., Cristoloveanu, S., Schrimpf, R.D., Feldman, L.C., Fleetwood, D.M., Galloway, K.F.

Electrochemical Society

R. Rilzenthaler, M. Gaillardin, K. Akarvardar, O. Faynot, C. Jahan, S. Cristoloveanu

Electrochemical Society

L.M. Camillo, J.A. Martino, E. Simoen, C. Claeys

Electrochemical Society

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12