Blank Cover Image

SOI for CMOS Logic and Memory Applications*

Author(s):
Sadana, D.K.  
Publication title:
ULSI Process Integration : proceedings of the International Symposium
Title of ser.:
Electrochemical Society Proceedings Series
Ser. no.:
2001-2
Pub. date:
2001
Page(from):
474
Page(to):
488
Pages:
15
Pub. info.:
Pennington, N.J.: Electrochemical Society
ISSN:
01616374
ISBN:
9781566773089 [1566773083]
Language:
English
Call no.:
E23400/2001-2
Type:
Conference Proceedings

Similar Items:

Cohen, G.M., Sadana, D.K.

Materials Research Society

Fritze,M., Burns,J.M., Wyatt,P.W., Astolfi,D.K., Forte,T., Yost,D., Davis,P., Curtis,A.V., Preble,D.M., Cann,S.G., …

SPIE - The International Society for Optical Engineering

Sadana, D K

Electrochemical Society

Sadana, A.

American Institute of Chemical Engineers

Bedell, S.W., Hovel, H., Domenicucci, A., Fogel, K., Reznicek, A., Sadana, D.K.

Electrochemical Society

Sadana, D.K., Hao, H.-Y., Maris, H.J.

Electrochemical Society

DeBlasi, J.M., Sadana, D.K., Norcott, M.H.

Materials Research Society

Sadana, D. K., Bedell, S. W., Reznicek, A., de Souza, J.P., Fogel, K., Hovel, H.

Electrochemical Society

Ioannou, D.P., Kontos, D.K., Ioannou, D.E.

Electrochemical Society

S.W. Bedell, K. Fogel, A. Reznicek, J. Ott, D. Sadana

Electrochemical Society

Liu, S.T., Liu, H., Nelson, D.K., Flanery, M., Hughes, H.L.

Electrochemical Society

12 Conference Proceedings Applications of X-ray Interferometry

Bowen,D.K.

Kluwer Academic Publishers

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12