Blank Cover Image

Ion Beam Damage Processes in GaN *

Author(s):
Kncheyev, S.O.
Williams, J.S.
Zou, J.
Jagadish, C.
Bradby, J.E.
Li, G.
1 more
Publication title:
III-Nitride Based Semiconductor Electronics and Optical Devices and thirty-fourth State-of-the-Art-Program on Compound Semiconductors (SOTAPOCS XXXIV) : proceedings of the International Symposia
Title of ser.:
Electrochemical Society Proceedings Series
Ser. no.:
2001-1
Pub. Year:
2001
Page(from):
150
Page(to):
160
Pages:
11
Pub. info.:
Pennington, N.J.: Electrochemical Society
ISSN:
01616374
ISBN:
9781566773072 [1566773075]
Language:
English
Call no.:
E23400/2001-1
Type:
Conference Proceedings

Similar Items:

Kucheyev, S.O., Bradby, J.E., Williams, J.S., Swain, M.V., Toth, M., Phillips, M.R., Jagadish, C.

Materials Research Society

Bradby, J.E., Williams, J.S., Wong-Leung, J., Swain, M.V., Munroe, P.

Materials Research Society

Kucheyev, S.O., Williams, J.S., Jagadish, C., Zou, J., Toth, M., Phillips, M.R., Tan, H.H., Li, G., Pearton, S.J.

Materials Research Society

Williams, J. S., Haberl, B., Bradby, J. E.

Materials Research Society

Williams, J.S., Haberl, B., Bradby, J.E.

Materials Research Society

Elliman, R.G., Ridgway, M.C., Johnson, S.T., Williams, J.S.

Materials Research Society

Tan, H.H., Williams, J.S., Zou, J., Cockayne, D.J.H., Pearton, S.J., Yuan, C.

Electrochemical Society

Jacobson, D.C., Pearton, S.J., Hull, R., Poate, J.M., Williams, J.S.

Materials Research Society

Bradby, J.E., Williams, J.S., Swain, M.V.

Materials Research Society

Elliman, R.G., Williams, J.S., Johnson, S.T., Nygren, E.

Materials Research Society

V. A. Coleman, J. E. Bradby, C. Jagadish, M. R. Phillips

Materials Research Society

Short, K. T., Chivers, D. J., Elliman, R. G., Liu, J., Pogany, A. P., Wagenfeld, H. K., Williams, J. S.

North-Holland

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12