Scanning Photo-Induced Impedance Microscopy
- Author(s):
- Publication title:
- New trends in electrochemical impedance spectroscopy (EIS) and electrochemical noise analysis (ENA) : proceedings of the International Symposium
- Title of ser.:
- Electrochemical Society Proceedings Series
- Ser. no.:
- 2000-24
- Pub. Year:
- 2000
- Page(from):
- 91
- Page(to):
- 98
- Pub. info.:
- Pennington, N.J.: Electrochemical Society
- ISSN:
- 01616374
- ISBN:
- 9781566772914 [1566772915]
- Language:
- English
- Call no.:
- E23400/200024
- Type:
- Conference Proceedings
Similar Items:
Electrochemical Society |
Kluwer Academic Publishers |
2
Conference Proceedings
Flaw detection in d33-mode ceramic multilayer actuators using impedance-frequency scans
Society of Photo-optical Instrumentation Engineers |
Society of Photo-optical Instrumentation Engineers |
3
Conference Proceedings
1.8 MeV Electron Bombardment-Induced Structural Changes on Graphite Surfaces Observed by Scanning Tunneling Microscopy
MRS - Materials Research Society |
9
Conference Proceedings
Digital in-line holographic microscopy applied to microfluidic studies [6112-23]
SPIE - The International Society of Optical Engineering |
4
Conference Proceedings
FFT Photo Impedance Characterization of Semiconductors for Solar Application
Electrochemical Society |
Society of Photo-optical Instrumentation Engineers |
Kluwer Academic Publishers |
Kluwer Academic Publishers |
SPIE - The International Society of Optical Engineering |
12
Conference Proceedings
ZrO2 as Dielectric Material for Device Characterization with Scanning Capacitance Microscopy
SPIE-The International Society for Optical Engineering |