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Fabrication and Materials Characterization of Pulsed Laser Deposited Nickel Suicide Ohmic Contacts to 4H n-SiC

Author(s):
Cole, M.W.
Joshi, P G.
Hubbard, C.W.
Ngo, E.
Demaree, J.D.
Hirvonen, I.K.
Wood, M.
Ervin, M.
Richardson, C.J.K.
Wisnioski, M.H.
5 more
Publication title:
High Speed Compound Semiconductor Devices for Wireless Applications and State-of-the-Art Program on Compound Semiconductors (XXXIII) : proceedings of the International Symposium
Title of ser.:
Electrochemical Society Proceedings Series
Ser. no.:
2000-18
Pub. Year:
2000
Page(from):
198
Page(to):
209
Pages:
12
Pub. info.:
Pennington, N.J.: Electrochemical Society
ISSN:
01616374
ISBN:
9781566772853 [1566772850]
Language:
English
Call no.:
E23400/200018
Type:
Conference Proceedings

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