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Carrier Lifetime Control and Characterization of High-Resistivity Silicon

Author(s):
Schuize, H.-J.
Frohnmeyer, A.
Niedernostheide, F.-J.
Hille, F.
Ttitto, P.
Pavelka, T.
Wachutka, U.
2 more
Publication title:
High Purity Silicon VI : proceedings of the sixth International Symposium
Title of ser.:
Electrochemical Society Proceedings Series
Ser. no.:
2000-17
Pub. date:
2000
Page(from):
414
Page(to):
424
Pages:
11
Pub. info.:
Bellingham, Wash.: Electrochemical Society
ISSN:
01616374
ISBN:
9781566772846 [1566772842]
Language:
English
Call no.:
E23400/200017
Type:
Conference Proceedings

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