Blank Cover Image

Scanning Electrochemical Microscopy of Defects in Thin Aluminum Oxide Films

Author(s):
Serebrennikova, I.
White, H.
Wall, D.
Missert, N.
Sullivan, J.P.
Barbour, J.C.
1 more
Publication title:
Oxide Films : proceedings of the International Symposium
Title of ser.:
Electrochemical Society Proceedings Series
Ser. no.:
2000-4
Pub. Year:
2000
Page(from):
139
Page(to):
148
Pages:
10
Pub. info.:
Pennington, N.J.: Electrochemical Society
ISSN:
01616374
ISBN:
9781566772693 [1566772699]
Language:
English
Call no.:
E23400/2000-4
Type:
Conference Proceedings

Similar Items:

1 Conference Proceedings Electronic Defects and Interface Potentials for Al Oxide Films on Al and Their Relationship to Electrochemical Properties

Sullivan, J.P., Dunn, R.G., Barbour, J.C., Wall, F.D., Missert, N., Buchheil, R.G.

Electrochemical Society
7 Conference Proceedings The Effect of Chlorine Implantation on the Pitting Behavior Aluminum

Wall, D., Barbour, C., Sullivan, J., Missert, N., Bunker, B., Nelson, G.

Electrochemical Society
2 Conference Proceedings CREVICE CORROSION INITIATION AT ENGINEERED Cu-RICH DEFECTS IN Al THIN FILMS

Missert, N., Son, K.A., Wall, F.D., Barbour, J.C., Sullivan, J.P., Zavadil, K.R., Copeland, R.G., Martinez, M.A., …

Electrochemical Society
8 Conference Proceedings Aluminum Corrosion at Systems of Engineered Cu Particles

Missert, N., Copeland, R.G., Wall, F.D., Johnson, C.M., Barbour, J.C., Kotula, P.

Electrochemical Society
3 Conference Proceedings The Electrical Properties of Native and Deposited Thin Aluminum Oxide Layers on Aluminum: Hydration Effects

Sullivan, J.P., Barbour, J.C., Dunn, R.G., Son, K.-A., Montes, L.P., Missert, N., Copeland, R.G.

Electrochemical Society
9 Conference Proceedings The Influence of Nanoengineered Cu Defects on Alumninum Pitting Initiation

Wall, F.D., Son, K.-A., Missert, N.A., Barbour, J., Martinez, M.A., Zavadil, K.R., Sullivan, J.P., Copeland, R.G., …

Electrochemical Society
4 Conference Proceedings In-Situ Fluorescence Microscopy of Al Thin Film Corrosion at Engineered Cu Islands

Missert, N., Copeland, R.C., Barbour, J.C., Mikkalson, J.E., Isaacs, H.

Electrochemical Society
10 Conference Proceedings Ionic Current Mapping Techniques and Applications to Aluminum-Copper Corrosion

Isascs, H.S., Jeffcoate, C.S., Missert, N.A., Barbour, J.C.

Electrochemical Society
5 Conference Proceedings Generation of Chloride Active Defects at the Aluminum Oxide Surface for the Study of Localized Corrosion Initiation

Zavadil, K.R., Barbour, J.C., Wall, F.D., Son, K.-A., Missert, N.

Electrochemical Society
11 Conference Proceedings Pit Initiation in AlOx/Al Thin Films

Son, K.-A., Barbour, J.C., Missert, N.A., Wall, F.D., Copeland, R.G., Martinez, M.A., Minor, K.G., Buchheit, R.G., …

Electrochemical Society
6 Conference Proceedings Oxide Film Formation From Electron Cyclotron Resonance (ECR) Plasmas

Barbour, J.C., Apblett, C.A., Denison, D.R., Sullivan, J.P.

Electrochemical Society
12 Conference Proceedings Growth and Oxidation of Thin Film Al2Cu

Son, K.-A., Missert, N., Barbour, I.C., Hren, J.I., Copeland, R.G., Minor, K.G.

Electrochemical Society
1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12