State of the Art Deep Silicon Anisotropic Etching on SOI Bonded Substrates for Dielectric Isolation and MEMS Applications
- Author(s):
Gormley, C. Yallup, K. Nevin, W.A. Bhardwaj, J. Ashraf, H. Huggett, P. Blackstone, S. - Publication title:
- Semiconductor wafer bonding : science, technology, and applications : proceedings of the international symposia
- Title of ser.:
- Electrochemical Society Proceedings Series
- Ser. no.:
- 99-35
- Pub. Year:
- 1999
- Page(from):
- 350
- Page(to):
- 361
- Pages:
- 12
- Pub. info.:
- Pennington, N.J.: Electrochemical Society
- ISSN:
- 01616374
- ISBN:
- 9781566772587 [1566772583]
- Language:
- English
- Call no.:
- E23400/99-35
- Type:
- Conference Proceedings
Similar Items:
Electrochemical Society |
SPIE-The International Society for Optical Engineering |
Electrochemical Society |
SPIE-The International Society for Optical Engineering |
Electrochemical Society |
Electrochemical Society |
Electrochemical Society |
SPIE-The International Society for Optical Engineering |
Electrochemical Society |
11
Conference Proceedings
Electrical and Structural Characterization of Silicon on Silicon Bonded Interfaces
Electrochemical Society |
Electrochemical Society |
12
Conference Proceedings
Effect of Material Properties on Stress-Induced Defect Generation in Trench SOI
Electrochemical Society |