Blank Cover Image

AN ARRAY ELECTRODE TECHNIQUE FOR MAPPING CORROSION POTENTIAL AT THE POLYMERIMETAL INTERFACE

Author(s):
Publication title:
Corrosion and reliability of electronic materials and devices : proceedings of the fourth international symposium
Title of ser.:
Electrochemical Society Proceedings Series
Ser. no.:
99-29
Pub. Year:
1999
Page(from):
282
Page(to):
287
Pages:
6
Pub. info.:
Pennington, NJ: Electrochemical Society
ISSN:
01616374
ISBN:
9781566772525 [1566772524]
Language:
English
Call no.:
E23400/99-29
Type:
Conference Proceedings

Similar Items:

Ludwig C. Nitsche, Anh Nguyen, Geoffrey Evans

American Institute of Chemical Engineers

K.-P. Lin, S.-C. Huang

Society of Photo-optical Instrumentation Engineers

W. Huang, X. Liu, X.C. Liu, T.Y. Zhou, S.Y. Zhuo

Trans Tech Publications

Bijentimala Keisham, Arron Cole, Phong Nguyen, Ankit Mehta, Vikas Berry

American Institute of Chemical Engineers

Nguyen, T., Pommersheim, J. M.

MRS - Materials Research Society

Zhuo,Z., Chong,T.C., Kwek,C.W.

SPIE-The International Society for Optical Engineering

Lunt, T.T., Brusamarello, V., Scully, J.R., Hudson, J.L.

Electrochemical Society

Reichert,C.T., Huang,T., Yapp,D.

SPIE-The International Society for Optical Engineering

Lin,K., Chen,T.-S.

SPIE-The International Society for Optical Engineering

X.R. Zhuo, X.G. Luo, X.Y. Lin, C.G. Xu

Trans Tech Publications

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12