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CHARACTERIZATION OF THE EFFECT OF Au/Al BONDPAD CORROSION ON MICROELECTRONIC DEVICE RELIABILITY

Author(s):
Sorensen, N.R.
Braithwaite, J.W.
Peterson, D.W.
Michael, J.R.
Robinson, D.G.
Strizich, M.P.
1 more
Publication title:
Corrosion and reliability of electronic materials and devices : proceedings of the fourth international symposium
Title of ser.:
Electrochemical Society Proceedings Series
Ser. no.:
99-29
Pub. Year:
1999
Page(from):
205
Page(to):
216
Pages:
12
Pub. info.:
Pennington, NJ: Electrochemical Society
ISSN:
01616374
ISBN:
9781566772525 [1566772524]
Language:
English
Call no.:
E23400/99-29
Type:
Conference Proceedings

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