Blank Cover Image

Theory for the Thickness Dependent Glass Transition Temperature of Amorphous Polymer Thin Films

Author(s):
Publication title:
Low and High Dielectric Constant Materials : Materials Science, Processing, and Reliability Issues, proceedings of the fourth International Symposium and Thin Film Materials for Advanced Packaging Technologies : proceedings of the second International Symposium
Title of ser.:
Electrochemical Society Proceedings Series
Ser. no.:
99-7
Pub. Year:
1999
Page(from):
53
Page(to):
61
Pages:
9
Pub. info.:
Pennington, N.J.: Electrochemical Society
ISSN:
01616374
ISBN:
9781566772297 [156677229X]
Language:
English
Call no.:
E23400/99-7
Type:
Conference Proceedings

Similar Items:

1 Conference Proceedings Thickness Dependent Dielectric Properties of Low-K Materials: A Theoretical Model

Hsu, D.T., Kim, H.K., Shi, F.G., Zhao, B., Brongo, M.

Electrochemical Society
7 Conference Proceedings Diffusional Dynamics Near the Glass Transition in Amorphous Polymer Thin Films

Deppe, Denise D., Torkelson, John M.

MRS - Materials Research Society
2 Conference Proceedings Thickness-dependent optical and dielectric behaviors of low-k polymer thin films

Kim,H.K., Shi,F.G., Zhao,B., Brongo,M.R.

SPIE-The International Society for Optical Engineering
8 Conference Proceedings Compatibility of Low Dielectric Constant Poly (arylether) with the Electroless Copper Deposition Solution

Hsu, D., Iskander, M., Tong, H.Y., Shi, F., Lopatin, S., Shacham-Diamand, Y., Zhao, B., Brongo, M., Vasudev, P.K.

Electrochemical Society
3 Conference Proceedings ILD thermal stability in deep-submicron technologies:from thin to ultrathin dielectric films

Hsu,D.T., Kim,H.K., Shi,F.G., Zhao,B., Brongo,M.R., Schilling,P., Wang,S.-Q.

SPIE - The International Society for Optical Engineering
9 Conference Proceedings OBSERVATION OF GLASS TRANSITION TEMPERATURES IN POLYMERIC THIN FILMS BY WAFER CURVATURE MEASUREMENTS

Townsend, P. H., Huber, B. S., Wang, D. S.

Materials Research Society
4 Conference Proceedings Interaction between the Electroless Copper Deposition Solution and the Low-k Fluorinated Dielectrics

Hsu, D.T., Tong, H.Y., Shi, F.G., Lopatin, S., Shacham-Diamand, Y., Zhao, B., Brongo, M., Vasudev, P.K.

Electrochemical Society
10 Conference Proceedings Supercooling vs overheating in the III-V semiconductor compound InSb: an abrupt-discontinuous relationship

Hsu,D.T., Tong,H.Y., Shi,F. G.

SPIE-The International Society for Optical Engineering
5 Conference Proceedings Microstructure Evolution of Amorphous Si1-xGex Thin Films

Tong, H. Y., Jiang, Q., Hsu, D., King, T. J., Shi, F. G.

MRS - Materials Research Society
11 Conference Proceedings Effect of barrier layer thickness on the performance of thin film transistors on glass substrates

Couillard,J.G., Ast,D.G., Moore,C.B., Fehlner,F.P.

SPIE-The International Society for Optical Engineering
6 Conference Proceedings "Material glass transition temperature, device thickness, and operational temperature effects on absorption of electro-optic polymer films"

Duff,A.-C.Le, Canva,M., Levy,Y., Brun,A., Galvan-Gonzalez,A., Pliska,T., Stegeman,G.L., Twieg,R.J., Chan,P., Lahlil,K., …

SPIE-The International Society for Optical Engineering
12 Conference Proceedings THE IMPORTANCE OF THICKNESS TO THE CRYSTALLIZATION OF AMORPHOUS THIN FILMS

Cardinale, Gregory F., Farrens, S. N., Howitt, D. G.

Materials Research Society
1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12