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Study of the Leakage Drain Current Components in Accumulation-Mode SOT pMOSFETs at High-Temperatures

Author(s):
  • Bellodi, M ( (Escola Politecnica da Universidade de Sao Paulo) )
  • Martino, J A ( (Escola Politecnica da Universidade de Sao Paulo) )
Publication title:
Proceedings of the Ninth International Symposium on Silicon-on-Insulator Technology and Devices
Title of ser.:
Electrochemical Society Proceedings Series
Ser. no.:
99-3
Pub. date:
1999
Page(from):
287
Page(to):
292
Pages:
6
Pub. info.:
Pennington, NJ: Electrochemical Society
ISSN:
01616374
ISBN:
9781566772259 [1566772257]
Language:
English
Call no.:
E23400/99-3
Type:
Conference Proceedings

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