Blank Cover Image

Edge and Floating Body Effects on Hot-Carrier-Induced Degradation in FD SOT n-MOSFETs

Author(s):
Publication title:
Proceedings of the Ninth International Symposium on Silicon-on-Insulator Technology and Devices
Title of ser.:
Electrochemical Society Proceedings Series
Ser. no.:
99-3
Pub. date:
1999
Page(from):
276
Page(to):
281
Pages:
6
Pub. info.:
Pennington, NJ: Electrochemical Society
ISSN:
01616374
ISBN:
9781566772259 [1566772257]
Language:
English
Call no.:
E23400/99-3
Type:
Conference Proceedings

Similar Items:

Renn, S.H., Pauly, E., Pelloie, J.L., Balestra, F.

Electrochemical Society

Szelag, B., Pangon, N., Balestra, F.

Electrochemical Society

Renn, S.H., Pelloie, J.L., Balestra, F.

Electrochemical Society

Dimitrakis, P., Balestra, J. Jomaah. F., Papajoannon, G.J.

Electrochemical Society

Rauly, E, Potavin, O, Balestra, F, Raynaud, C

Electrochemical Society

Lee, J-W, Kim, H-K, Lee, W-H, Oh, M-R, Kob, Y-H

Electrochemical Society

Pretet, I., Cristoloveanu, S., Alliben, F., Zaslavsky, A., Raynaud, C.

Electrochemical Society

H. Chen, S. Chen, C. Lu, C. Liu, F. Chiu

Electrochemical Society

Duan, F.L., Zhao, X., Ioannou, D.E., Hughes, H.L., Liu, S.T.

Electrochemical Society

Bhuva,B.L., Janapaty,V., Bui,N., Kerns,S.E.

SPIE-The International Society for Optical Engineering

Sinha, S P, Ii, F D, loonnou, D E, Jenkins, W C, Hughes, H L, Lin, M S

Electrochemical Society

Ling, C.H.

Electrochemical Society

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12