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A Steady-state Ramp Method for Carrier Lifetime Measurement in the SOI MOSFET

Author(s):
  • Cheng, Z-Y ( (National University of Singapore) )
  • Ling, C H ( (National University of Singapore) )
Publication title:
Proceedings of the Ninth International Symposium on Silicon-on-Insulator Technology and Devices
Title of ser.:
Electrochemical Society Proceedings Series
Ser. no.:
99-3
Pub. date:
1999
Page(from):
207
Page(to):
212
Pages:
6
Pub. info.:
Pennington, NJ: Electrochemical Society
ISSN:
01616374
ISBN:
9781566772259 [1566772257]
Language:
English
Call no.:
E23400/99-3
Type:
Conference Proceedings

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