Blank Cover Image

Process-Induced Defects in Silicon: A Never Ending Story?

Author(s):
Publication title:
Proceedings of the Third International Symposium on Defects in Silicon
Title of ser.:
Electrochemical Society Proceedings Series
Ser. no.:
99-1
Pub. date:
1999
Page(from):
19
Page(to):
37
Pages:
19
Pub. info.:
Pennington, NJ: Electrochemical Society
ISSN:
01616374
ISBN:
9781566772235 [1566772230]
Language:
English
Call no.:
E23400/99-1
Type:
Conference Proceedings

Similar Items:

D. Possner, B.O. Kolbesen, H. Cerva, V. Kluppel

Electrochemical Society

Kolbesen O. B.

Kluwer Academic Publishers

Cerva, H., Hammerl, E., Lemme, R., Schwalke, U., Wangemann, K., Zoth, G.

Electrochemical Society

Doll, O., Kolbesen, B.O.

SPIE-The International Society for Optical Engineering

Cerva, Hans, Oppolzer, Helmut

Materials Research Society

Kolbesen,B.O., Bergholz,W., Wendt,H.

Trans Tech Publications

Metz, S., Kilian, G., Mainka, G., Angelkort, C., Rittmeyer, C., Stelter, H., Fester, A., Kolbesen, B.O.

Electrochemical Society

Schulze, H-J., Kolbesen, B. O.

MRS - Materials Research Society

B. O. Kolbesen

Electrochemical Society

J. Maehliss, A. Abbadie, F. Brunier, B.O. Kolbesen

Electrochemical Society

Kolbesen O. B.

Martinus Nijhoff Publishers

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12