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The Influence of Nanoengineered Cu Defects on Alumninum Pitting Initiation

Author(s):
Wall, F.D.
Son, K.-A.
Missert, N.A.
Barbour, J.
Martinez, M.A.
Zavadil, K.R.
Sullivan, J.P.
Copeland, R.G.
Cieslak, W.R.
Buchheit, R.
Isaacs, H.
6 more
Publication title:
Proceedings of the Symposium on Critical Factors in Localized Corrosion III : a symposium in honor of the 70th birthday of Jerome Kruger
Title of ser.:
Electrochemical Society Proceedings Series
Ser. no.:
98-17
Pub. Year:
1998
Page(from):
701
Page(to):
712
Pub. info.:
Pennington, New Jersey: Electrochemical Society
ISSN:
01616374
ISBN:
9781566772112 [1566772117]
Language:
English
Call no.:
E23400/98-17
Type:
Conference Proceedings

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