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A Reliability Model for Time Dependent Dielectric Breakdown (TDDB) in Silicon Nitride Capacitors

Author(s):
Scarpulla, J.
Ahlers, E.D.
Eng, D.C.
Leung, D.L.
Olson, S.R.
Wu, C.S.
1 more
Publication title:
Proceedings of the Symposium on Light Emitting Devices for Optoelectronic Applications and the Twenty-Eighth State-of-the-Art Program on Compound Semiconductors
Title of ser.:
Electrochemical Society Proceedings Series
Ser. no.:
98-2
Pub. Year:
1998
Page(from):
479
Page(to):
500
Pub. info.:
Pennington, NJ: Electrochemical Society
ISSN:
01616374
ISBN:
9781566771948 [1566771943]
Language:
English
Call no.:
E23400/98-2
Type:
Conference Proceedings

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