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Thermal Behavior of Ni Ohmic Contacts to n-SiC: A Materials and Electrical Reliability Investigation

Author(s):
Cole, M.W.
Hubbard, C.
Demaree, D.
Fountzzoulas, C.G.
Natarajan, A.
Miller, R.A.
Harris, D.
Xie, K.
Searson, P.
4 more
Publication title:
Proceedings of the Symposium on Light Emitting Devices for Optoelectronic Applications and the Twenty-Eighth State-of-the-Art Program on Compound Semiconductors
Title of ser.:
Electrochemical Society Proceedings Series
Ser. no.:
98-2
Pub. Year:
1998
Page(from):
392
Page(to):
399
Pub. info.:
Pennington, NJ: Electrochemical Society
ISSN:
01616374
ISBN:
9781566771948 [1566771943]
Language:
English
Call no.:
E23400/98-2
Type:
Conference Proceedings

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